This book contains extended and revised versions of the best papers that were presented during the thirteenth edition of the IFIP TC 10 International Conference on Very Large Scale Integration, a Global System-on-Chip Design and CAD conference. The purpose of this conference is to provide a forum to exchange ideas and show industrial and academic research results in the field of microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.